Tip-enhanced photoluminescence nano-spectroscopy and nano-imaging
SCIE
SCOPUS
- Title
- Tip-enhanced photoluminescence nano-spectroscopy and nano-imaging
- Authors
- Lee, Hyeongwoo; Lee, Dong Yun; Kang, Min Gu; Koo, Yeonjeong; Kim, Taehyun; Park, Kyoung-Duck
- Date Issued
- 2020-09
- Publisher
- WALTER DE GRUYTER GMBH
- Abstract
- AbstractPhotoluminescence (PL), a photo-excited spontaneous emission process, provides a wealth of optical and electronic properties of materials, which enable microscopic and spectroscopic imaging, biomedical sensing and diagnosis, and a range of photonic device applications. However, conventional far-field PL measurements have limitations in sensitivity and spatial resolution, especially to investigate single nano-materials or nano-scale dimension of them. In contrast, tip-enhanced photoluminescence (TEPL) nano-spectroscopy provides an extremely high sensitivity with <10 nm spatial resolution, which allows the desired nano-scale characterizations. With outstanding and unique optical properties, low-dimensional quantum materials have recently attracted much attention, and TEPL characterizations, i. e., probing and imaging, and even control at the nano-scale, have been extensively studied. In this review, we discuss the fundamental working mechanism of PL enhancement by plasmonic tip, and then highlight recent advances in TEPL studies for low-dimensional quantum materials. Finally, we discuss several remaining challenges of TEPL nano-spectroscopy and nano-imaging, such as implementation in non-ambient media and in situ environments, limitations in sample structure, and control of near-field polarization, with perspectives of the approach and its applications.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/114696
- DOI
- 10.1515/nanoph-2020-0079
- ISSN
- 2192-8606
- Article Type
- Article
- Citation
- Nanophotonics, vol. 9, no. 10, page. 3089 - 3110, 2020-09
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- There are no files associated with this item.
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