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Cited 5 time in webofscience Cited 7 time in scopus
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dc.contributor.authorCHUNG, CH-
dc.contributor.authorHAN, JH-
dc.contributor.authorLEE, KY-
dc.contributor.authorMOON, SH-
dc.contributor.authorRHEE, SW-
dc.date.accessioned2015-06-25T02:29:37Z-
dc.date.available2015-06-25T02:29:37Z-
dc.date.created2009-03-16-
dc.date.issued1992-12-
dc.identifier.issn0013-4651-
dc.identifier.other2015-OAK-0000011129en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/11067-
dc.description.abstractCalculations have been made for the equilibrium states of the Si-H-F system based on thermochemical data to estimate the partial pressures of gaseous species, the relation between the Si/F and the F/H ratios in the vapor phase, and the boundary curves to define the conditions of silicon deposition and etching. The results obtained are similar in general to those for the Si-H-Cl and the Si-H-Br systems except for some differences in the absolute magnitudes and the conditions of the deposition/etching transitions. The boundary curves for silicon deposition and etching change characteristically with the initial feed compositions, i.e., two curves meet and separate again as SiH4 is added to SiF4 in the feed.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherELECTROCHEMICAL SOC INC-
dc.relation.isPartOfJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleTHERMODYNAMIC EVALUATION OF EQUILIBRIUM COMPOSITIONS IN THE SI-H-F SYSTEM-
dc.typeArticle-
dc.contributor.college화학공학과en_US
dc.identifier.doi10.1149/1.2069112-
dc.author.googleCHUNG, CHen_US
dc.author.googleHAN, JHen_US
dc.author.googleRHEE, SWen_US
dc.author.googleMOON, SHen_US
dc.author.googleLEE, KYen_US
dc.relation.volume139en_US
dc.relation.startpage3539en_US
dc.relation.lastpage3544en_US
dc.contributor.id10052631en_US
dc.relation.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.139, no.12, pp.3539 - 3544-
dc.identifier.wosidA1992KC33600032-
dc.citation.endPage3544-
dc.citation.number12-
dc.citation.startPage3539-
dc.citation.titleJOURNAL OF THE ELECTROCHEMICAL SOCIETY-
dc.citation.volume139-
dc.contributor.affiliatedAuthorRHEE, SW-
dc.identifier.scopusid2-s2.0-0026961640-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc5-
dc.type.docTypeArticle-
dc.subject.keywordPlusPHOTOCHEMICAL VAPOR-DEPOSITION-
dc.subject.keywordPlusLOW-TEMPERATURE-
dc.subject.keywordPlusEPITAXIAL-GROWTH-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlus250-DEGREES-C-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusCL-
dc.relation.journalWebOfScienceCategoryElectrochemistry-
dc.relation.journalWebOfScienceCategoryMaterials Science, Coatings & Films-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaElectrochemistry-
dc.relation.journalResearchAreaMaterials Science-

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