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Wafer Map Failure Pattern Classification using Geometrical Transformation Invariant Convolutional Neural Network
- Title
- Wafer Map Failure Pattern Classification using Geometrical Transformation Invariant Convolutional Neural Network
- Authors
- IL, JOO JEONG; LEE, SEUNGCHUL
- Date Issued
- 2021-04-28
- Publisher
- 대한기계학회
- Article Type
- Conference
- Citation
- 대한기계학회 신뢰성부문 2021년도 춘계학술대회, 2021-04-28
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Related Researcher
- 이승철LEE, SEUNGCHUL
- Dept of Mechanical Enginrg