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Improvement of Device Reliability on Organic Memory Devices

Title
Improvement of Device Reliability on Organic Memory Devices
Authors
LEE, JANG SIK
Date Issued
2020-01-20
Publisher
IEEE
URI
https://oasis.postech.ac.kr/handle/2014.oak/106327
Article Type
Conference
Citation
ICEIC 2020, 2020-01-20
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이장식LEE, JANG SIK
Dept of Materials Science & Enginrg
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