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dc.contributor.authorWRITAM, BANERJEE-
dc.contributor.authorIlya V.Karpov-
dc.contributor.authorAshish Agrawal-
dc.contributor.authorKIM, SEONGHUN-
dc.contributor.author이승우-
dc.contributor.authorLEE, SANGMIN-
dc.contributor.authorLEE, DONGHWA-
dc.contributor.authorHWANG, HYUNSANG-
dc.date.accessioned2021-06-01T04:22:05Z-
dc.date.available2021-06-01T04:22:05Z-
dc.date.created2021-03-04-
dc.date.issued2020-12-17-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/105464-
dc.publisherIEEE-
dc.relation.isPartOf2020 IEEE International Electron Devices Meeting-
dc.relation.isPartOf2020 IEEE International Electron Devices Meeting-
dc.titleHighly-stable (< 3% fluctuation) Ag-based Threshold Switch with Extreme-low OFF Current of 0.1 pA, Extreme-high Selectivity of 109 and High Endurance of 109-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2020 IEEE International Electron Devices Meeting-
dc.identifier.wosid000717011600071-
dc.citation.conferenceDate2020-12-12-
dc.citation.conferencePlaceUS-
dc.citation.title2020 IEEE International Electron Devices Meeting-
dc.contributor.affiliatedAuthorWRITAM, BANERJEE-
dc.contributor.affiliatedAuthorKIM, SEONGHUN-
dc.contributor.affiliatedAuthor이승우-
dc.contributor.affiliatedAuthorLEE, SANGMIN-
dc.contributor.affiliatedAuthorLEE, DONGHWA-
dc.contributor.affiliatedAuthorHWANG, HYUNSANG-
dc.identifier.scopusid2-s2.0-85102921899-
dc.description.journalClass1-
dc.description.journalClass1-

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황현상HWANG, HYUNSANG
Dept of Materials Science & Enginrg
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