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Structural changes of silicon dioxide films caused by synchrotron irradiation

Title
Structural changes of silicon dioxide films caused by synchrotron irradiation
Authors
Park, YBRhee, SWImaizumi, YUrisu, T
Date Issued
Jan-1996
Publisher
AMER INST PHYSICS
URI
http://oasis.postech.ac.kr/handle/2014.oak/10459
ISSN
0021-8979
Article Type
Article
Citation
JOURNAL OF APPLIED PHYSICS, vol. 80, no. 2, page. 1236 - 1238, 1996-01
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