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Near-Field Free Space Characterization And Analysis for Dielectric Thickness

Title
Near-Field Free Space Characterization And Analysis for Dielectric Thickness
Authors
HONG, WONBIN
Date Issued
2018-11-23
Publisher
한국전자파학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/102915
Article Type
Conference
Citation
2018년도 제 30차 종합학술대회, 2018-11-23
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홍원빈HONG, WONBIN
Dept of Electrical Enginrg
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