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dc.contributor.authorKim, M-
dc.contributor.authorKim, B-
dc.date.accessioned2015-06-25T01:59:51Z-
dc.date.available2015-06-25T01:59:51Z-
dc.date.created2009-03-18-
dc.date.issued1999-06-
dc.identifier.issn0916-8524-
dc.identifier.other2015-OAK-0000000803en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/10274-
dc.description.abstractHawkins noise model is modified fur HBT application. The non-ideal ideality factor of HBT is included in both dynamic resistance and noise figure equations. Emitter resistance is also included. The extraction method of noise resistance R-n is developed. Based on the method, a simple analytic equation of R-n is derived and experimentally verified. The effects of noise sources on minimum noise figure are analyzed. The dominant noise sources are the shot noises of emitter and collector currents. Generally, when the minimum noise figure is measured at various current levels, there exists an current level at which the slope of minimum noise figure curve is zero. The zero slope current level coincides with the current level at which the noise contribution of the emitter and collector shot noises including the cancellation by correlation of two sources is minimum. Parasitic resistance degrades output noise through the shot noise amplification with a minor effect of the thermal noise of itself.-
dc.description.statementofresponsibilityopenen_US
dc.languageEnglish-
dc.publisherIEICE-INST ELECTRONICS INFORMATION CO-
dc.relation.isPartOfIEICE TRANSACTIONS ON ELECTRONICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleAnalysis of high frequency noise of AlGaAs GaAs HBT-
dc.typeArticle-
dc.contributor.college전자전기공학과en_US
dc.author.googleKim, Men_US
dc.author.googleKim, Ben_US
dc.relation.volumeE82Cen_US
dc.relation.issue6en_US
dc.relation.startpage1018en_US
dc.relation.lastpage1024en_US
dc.contributor.id10106173en_US
dc.relation.journalIEICE TRANSACTIONS ON ELECTRONICSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIEen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.identifier.bibliographicCitationIEICE TRANSACTIONS ON ELECTRONICS, v.E82C, no.6, pp.1018 - 1024-
dc.identifier.wosid000081211400028-
dc.date.tcdate2018-03-23-
dc.citation.endPage1024-
dc.citation.number6-
dc.citation.startPage1018-
dc.citation.titleIEICE TRANSACTIONS ON ELECTRONICS-
dc.citation.volumeE82C-
dc.contributor.affiliatedAuthorKim, B-
dc.identifier.scopusid2-s2.0-0033357464-
dc.description.journalClass1-
dc.description.journalClass1-
dc.type.docTypeArticle-
dc.subject.keywordPlusHETEROJUNCTION BIPOLAR-TRANSISTORS-
dc.subject.keywordPlusMICROWAVE-
dc.subject.keywordPlusFIGURE-
dc.subject.keywordPlusBIAS-
dc.subject.keywordAuthorHawkins model-
dc.subject.keywordAuthorminimum noise figure-
dc.subject.keywordAuthornoise resistance-
dc.subject.keywordAuthorideality factor-
dc.subject.keywordAuthorcorrelation-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-

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김범만KIM, BUM MAN
Dept of Electrical Enginrg
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