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Browsing by  Author이선행

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하
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Showing results 1 to 5 of 5
Conference
Channel width dependence of mechanical stress effects induced by shallow

European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

Conference
Effect of electron–electron scattering at an elevated temperature on device

European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01

Conference
Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs

European Symposium on Reliability of Electron Devices,Failure Physics and Analysis, 2013-09-30

Thesis
HDP/SOG STI로부터 발생한 STRAIN이 RECESS CHANNEL ARRAY TRANSISTOR 구조 DRAM의 DATA RETENTION TIME에 미치는 특성 평가

Thesis(Master), 2010

Thesis
Recess Channel Array Transistor에서 발생하는 Mechanical Stress의 추출 방법 및 Nanoscale MOSFETs의 신뢰성에 대한 연구

Thesis(Doctor), 2013

1
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