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Showing results 14 to 17 of 17
Article
The use of diffraction and phase X-ray contrast in study of materialsSCIESCOPUS

CRYSTALLOGRAPHY REPORTS, vol. 49, page. S33 - S39, 2004-01

Article
White X-ray beam topography and radiography of Si1-xGex crystals bonded to siliconSCIESCOPUS

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, vol. 204, no. 8, page. 2669 - 2674, 2007-08

Article
X-ray imaging and TEM study of micropipes related to their propagation through porous SiC layer/SiC epilayer interface.SCIESCOPUS

MATERIALS SCIENCE FORUM, vol. 457-460, page. 363 - 366, 2004-01

Article
X-ray studies of Si1-xGex single crystalsSCIESCOPUS

PHYSICS OF THE SOLID STATE, vol. 47, no. 7, page. 1225 - 1232, 2005-01

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