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Showing results 1 to 1 of 1
Article
Highly reliable resistive switching without an initial forming operation by defect engineering
SCIE
SCOPUS
IEEE Electron Device Letters, vol. 34, no. 12, page. 1515 - 1517, 2013-12
Lee, S
;
Lee, D
;
Woo, J
;
Cha, E
;
Park, J
;
et al
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