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Showing results 2 to 5 of 5
Conference
Indium composition fluctuation in InGaN well layer of LED devices analyzed by

9th International Conference on Nitride Semiconductor, 2011-07-10

Conference
Indium composition fluctuation in InGaN well layer of LED devices analyzed by APT and STEM-EELS

5th Congress of the International Union of Microbeam Analysis Societies(IUMAS-V), 2011-05-22

Conference
Inhomogeneity of a highly efficient InGaN based blue LED studied by three-dimensional atom probe tomography

대한전자현미경학회 춘계학술대회, 2009-05-13

Conference
강 중 상 분석을 이용한 3차원 원자 침 분석기(3D- Atom Probe Tomography)의 시편 제조 최적화 기술 개발

대한재료금속학회 춘계학술대회, 2009-04-23

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