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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Showing results 1 to 7 of 7

Issue Date	Title
2010-Feb	Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model 17th Korean Conference on Semiconductors (2010), 2010-02-24 백록현; 백창기; 최현식; 이정수; 여윤영; 여경환; 김동원; 김기남; 김대만; 정윤하
2011-Aug	Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk IEEE-NANO (2011), 2011-08-15 백록현; 고명동; 이상현; 백창기; 여경환; 김동원; 이정수; 김대만; 정윤하
2010-Sep	C-V Characteristics and Analysis of Undoped Gate-All-Around Nanowire FET Array Solid State Devices and Materials (SSDM2010), page. 1277 - 1278, 2010-09-21 백록현; 백창기; 이상현; 석성대; M.Li; 여윤영; 여경환; 김동원; 이정수; 김대만; 정윤하
2010-May	Characteristics of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects IEEE IRPS(2010), 2010-05-02 백록현; 백창기; 최현식; 사공현철; 이상현; 최길복; 송승현; 박찬훈; 이정수; 여윤영; 여경환; 김동원; 김기남; 김대만; 정윤하
2010-Oct	Comparative Study of C-V Characteristics in Si-NWFET and MOSFET (Invited paper) IEEE Nanotechnology Materials and Devices Conference (NMDC2010), 2010-10-12 백록현; 정윤하; 백창기; 여경환; 김동원; 정진용; 김대만
2011-Feb	Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress 18th Korean Conference on Semiconductors (2011), 2011-02-16 백록현; 이상현; 박찬훈; 고명동; 여경환; 김동원; 김대만; 정윤하
2011-Oct	Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique IEEE Nanotechnology Materials and Devices Conference (NMDC2011), 2011-10-19 백록현; 김예람; 이상현; 백창기; 여경환; 김동원; 이정수; 정윤하

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