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OH, SANG HO (오상호)

Dept of Materials Science & Engineering(신소재공학과)

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FILMS:3||ATOMICRESOLUTION:3||ALUMINUM:3||COPPER:3||DEFORMATION:3||Shot peening:2||LAYER:2||DYNAMICS:2||MICROPHASE SEPARATION:2||ESCHERICHIACOLI:2||Darkfield inline holography:2||LARGEAREA:2||Surface hardening:2||FTIR SPECTROSCOPY:2||DIOXIDE CAPTURE:2||Multiquantum well:2||FOCUSVARIATION:2||MICROGRAPHS:2||CHEMICALVAPORDEPOSITION:2||LAYERS:2||ELECTRONMICROSCOPE:2||CO2 sequestration:2||SITE:2||INTENSITY EQUATION:2||ORDERDISORDER TRANSITION:2||NANOTECHNOLOGY:2||carbonic anhydrase:2||BIOSILICA:2||Lattice strain:2||CARBON:2||DATASTORAGE:2||POLYMERS:2||STYRENE:2||INTERFACES:2||MINERALIZATION:2||GROWTH:2||Dislocations:2||biomineralization:2||biosilica:2||ENCAPSULATION:2||SUPPORT:2||MICROSCOPY:2||in situ TEM:2||immobilization:2||silaffin:2||ENZYME IMMOBILIZATION:2||SBA15:2||Transport of intensity equation:2||TRANSPORT:2||ALGORITHM:2||RECONSTRUCTION:2||Light emitting diode:2||STABILITY:2||IMAGES:2||THINFILMS:2||BEHAVIOR:2||LTSOFC:1||METHANE:1||Compound layer free:1||NANOCRYSTALLIZATION:1||Depolarization field:1||THERMODYNAMIC THEORY:1||90DEGREES DOMAINS:1||Nanocrystallization:1||ELECTRONMICROSCOPY:1||DIFFRACTION:1||nanowires:1||point defects:1||SI:1||Aluminum:1||compressive stress:1||Magnesium:1||Solidliquid interface:1||HARDSPHERE FLUID:1||HREM IMAGES:1||strontium titanium oxide:1||Density functional theory:1||Piezoelectric polarizations:1||PERFORMANCE:1||Nitriding:1||CORROSIONRESISTANCE:1||WEAR:1||Polarization switching:1||NANOMETERSCALE:1||Li batteries:1||SISIO2:1||MOLECULARDYNAMICS:1||FOCALSERIES:1||ULTRAHIGHSTRENGTH:1||density functional theory:1||priority journal:1||two dimensional electron liquid:1||Electron holography:1||Dipole interaction energy:1||Light emitting diodes:1||REALTIME OBSERVATION:1||CONDUCTIVE FILAMENT:1||ELECTRODES:1||NI:1||In situ transmission electron microscopy:1||Ferroelectric thin film:1||90 degrees Domains:1||Surface alloying:1||Focused ion beam (FIB):1||High resolution transmission electron microscopy:1||EXIT WAVE RECONSTRUCTION:1||Article:1||Gallium alloys:1||Holography:1||Electrostatic potentials:1||NANOFILAMENT:1||CATALYSTS:1||NICKEL:1||EXCESS NITROGEN:1||MODEL:1||olivine phosphates:1||Gallium:1||CRYSTAL PLASTICITY:1||SINGLECRYSTAL:1||lanthanum aluminum oxide:1||oxide:1||nanoimaging:1||Probes:1||Atom probe tomography:1||EVOLUTION:1||Ni/GDC20 anode:1||Microstructural refinement:1||HYDROGEN OXIDATION:1||SOFCS:1||TEMPERATURES:1||POLARIZATION:1||scanning transmission electron microscopy:1||aberration correction:1||SUBSTRATE:1||Ag2Te nanowire:1||SURFACEDIFFUSION:1||Sublimation:1||COMPRESSION:1||Inline holography:1||DISLOCATION NUCLEATION:1||NANOWHISKERS:1||unclassified drug:1||crystal structure:1||quantum chemistry:1||surface property:1||Piezoelectricity:1||Polarization:1||Semiconductor quantum wells:1||Nonpolar:1||PALLADIUM:1||IMMERSION IONIMPLANTATION:1||Cation ordering:1||highresolution electron microscopy:1||Polyimide:1||In situ TEM:1||epitaxial growth:1||Structural correlation length:1||TRANSMISSION ELECTRONMICROSCOPY:1||SIMULATION:1||EFFICIENCY:1||GOLD NANOWIRES:1||SILVER NANOWIRES:1||analytic method:1||bulk density:1||image reconstruction:1||Strain energy:1||TIO2:1||Palladium infiltration:1||AISI H13 Steel:1||MECHANICAL ATTRITION TREATMENT:1||FERRITE MATRIX:1||SOLIDSOLUTION SYSTEM:1||Zcontrast:1||ATOMS:1||TEM:1||SPECIMEN:1||SOFT REPULSIVE WALL:1||CONTACT:1||MECHANICALPROPERTIES:1||PLASTICITY:1||holography:1||Atoms:1||Inline electron holography:1||InGaN:1||Inhomogeneous distribution:1||PdCl2 precursor:1||CERIABASED ANODES:1||IRON:1||Lamellar structure:1||INDUCED GRAINREFINEMENT:1||STRESS:1||semiconductor devices:1||ORIGIN:1||Thin films:1||phase transitions:1||TEMPERATURE:1||SAMPLES:1||STRENGTH:1||Atomic ordering:1||PHOTOVOLTAIC DEVICES:1||GRATINGS:1||electric field:1||physical chemistry:1||Indium:1||

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