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KIM, JONG KYU (김종규)

Dept of Materials Science & Engineering(신소재공학과)

Field(s)

Keyword

GAN:8||REFLECTION:7||EFFICIENCY:6||FILMS:6||ohmic contact:5||DIODES:5||GALLIUM NITRIDE:5||NANOSTRUCTURES:5||ptype GaN:5||DESIGN:4||LAYER:4||Light emitting diodes:4||LIGHTEMITTINGDIODES:4||microstructure:4||lightemitting diodes:4||TRANSISTOR:4||efficiency droop:4||FIELDEFFECT TRANSISTORS:4||GROWTH:4||GLANCING ANGLE DEPOSITION:4||NTYPE GAN:4||Light emitting diode:3||OMNIDIRECTIONAL REFLECTOR:3||PERFORMANCE:3||EMISSION:3||OHMIC CONTACTS:3||LASERDIODES:3||LOWREFRACTIVEINDEX:3||LAYERS:3||AlGaN:3||ARRAY:3||ENHANCEMENT:3||GENETIC ALGORITHM:3||PTYPE GAN:3||oblique angle deposition:2||Light:2||THINFILMS:2||CONTACTS:2||Pd ohmic contact:2||xray scattering:2||INP:2||Darkfield inline holography:2||ATOMICRESOLUTION:2||LOWRESISTANCE:2||IIIV semiconductors:2||Multiquantum well:2||FOCUSVARIATION:2||MICROGRAPHS:2||photoemission spectroscopy:2||COATINGS:2||Siface:2||SURFACES:2||light emission:2||SINGLEPHOTON SOURCES:2||INTENSITY EQUATION:2||Lattice strain:2||SURFACEDIFFUSION:2||DIELECTRICS:2||(NH4)(2)Sx treatment:2||light emitting diodes:2||Substrates:2||EPITAXY:2||LEDS:2||SCHOTTKY CONTACT:2||AFM:2||aqua regia treatment:2||3D branched nanowires:2||LEDs:2||GaN:2||MICROSCOPY:2||SYSTEMS:2||Cface:2||SIO2:2||hydrothermal growth:2||NANORODS:2||PHOTOVOLTAIC DEVICES:2||GRATINGS:2||Transport of intensity equation:2||TRANSPORT:2||ALGORITHM:2||IMAGES:2||ZnO:2||THERMALSTABILITY:2||RECONSTRUCTION:2||TRIHALIDE:1||fluorescence:1||BROADBAND:1||ELECTRONBLOCKING LAYER:1||HOLLOW HEMISPHERES:1||METAL:1||GANGLIONCELLS:1||SUBWAVELENGTH STRUCTURES:1||PD/AU:1||Gold compounds:1||Persistent Photoconductivity:1||Photocurrent measurement:1||SINGLECRYSTAL GAN:1||dislocation density:1||SINGLE:1||LASER DIODE:1||BULK ALN:1||4H SiC:1||CN:1||SILICONCARBIDE:1||metalorganic vapor phase epitaxy:1||NGAN:1||Density functional theory:1||Piezoelectric polarizations:1||MICROSTRUCTURE:1||BNI2:1||Epitaxial growth:1||Ultraviolet radiation:1||Epitaxial lateral overgrowth:1||Guided propagation:1||Lightextraction efficiency:1||Growth kinetics:1||Solution phase synthesis:1||Microwave assisted synthesis:1||SI:1||Electrical characteristic:1||Recombination events:1||ightemitting diodes:1||CH3NH3PBI3:1||graphene oxide:1||laser diode:1||tailoredrefractiveindex:1||solar cells:1||HIGHPOWER:1||Schottky barrier diodes:1||Photocatalytic efficiency:1||LED:1||NITRIDE:1||LASER:1||Photonic bandgap materials:1||NI/AU:1||Electron holography:1||Dipole interaction energy:1||Sapphire:1||Silicon wafers:1||Niobium compounds:1||Tellurium compounds:1||TITANIUMDIOXIDE:1||OXIDATION:1||SEMICONDUCTORS:1||Electron tunneling:1||Comparative studies:1||UV LEDS:1||ABSORBER:1||conjugated polymer:1||GREEN EMISSION:1||POLYFLUORENE:1||POROUS SILICON:1||omnidirectional:1||compound semiconductor:1||INGAN:1||ELECTRONIC NOSE:1||CARBON NANOTUBES:1||NANOWIRE:1||H SOLARCELLS:1||NANOPILLAR ARRAYS:1||POLYMER:1||Electromagnetic wave absorption:1||Metal functionalization:1||Photogenerated carriers:1||Visible light absorption:1||carrier localization:1||EMITTINGDIODES:1||UV LEDs:1||NM:1||nitride:1||Electroluminescence:1||quantum wells:1||Current density:1||Xray diffraction:1||MECHANISM:1||Holography:1||Gallium alloys:1||Electrostatic potentials:1||Low growth temperature:1||Microwave absorption:1||EXFOLIATED METALLIC MOS2:1||Color vision:1||Semiconductor diodes:1||genetic algorithm:1||LENGTHS:1||coreshell structure:1||ENERGYTRANSFER:1||LITHIUM STORAGE:1||TEMPERATURE CHARACTERISTICS:1||photovoltaic devices:1||SENSITIVITY:1||SOLARCELLS:1||diffuse reflector:1||XPS:1||temperature coefficient:1||ALGAN:1||chemical vapor deposition:1||XRD:1||NICKEL:1||light emitting diode:1||SILICON SOLARCELLS:1||Probes:1||Atom probe tomography:1||PLATEFIN STRUCTURE:1||EVOLUTION:1||Injection currents:1||Nanoscale patterns:1||Synthesis (chemical):1||Electrically conductive:1||Microwave conditions:1||Transition metal dichalcogenides:1||Heterojunctions:1||Heterojunction diodes:1||ARRAYS:1||ORGANOMETAL HALIDE PEROVSKITES:1||ELECTRON:1||green emission:1||SHELL:1||Lightemitting diode:1||carrier asymmetry:1||QUANTUMWELL:1||POLARIZATION:1||BAND:1||GAAS:1||encapsulant:1||phosphor:1||BROADBAND ANTIREFLECTION:1||MICROLENS ARRAYS:1||Metals:1||NFace pGaN:1||WIDE TRANSMITTANCE BANDS:1||CVD:1||diodeforward voltage:1||SILICA:1||Refractive index:1||Fermi level:1||band bending:1||Piezoelectricity:1||Polarization:1||Semiconductor quantum wells:1||Nonpolar:1||Nanotechnology:1||Gallium nitride:1||INPLANE EMISSION:1||DEPOSITION:1||FLUORESCENCE:1||NANOSPHERES:1||QUANTUM EFFICIENCY:1||SURFACE:1||GRAINSIZE:1||Photocatalytic performance:1||Precious metals:1||Internal photoemission:1||Titanium compounds:1||Surface Treatment:1||SURFACETREATMENT:1||gallium nitride:1||XEROGEL FILMS:1||Sic:1||junction temperature:1||and thermal resistance:1||NI/AU CONTACT:1||Thin film growth:1||Electron beam deposition:1||SCHOTTKYBARRIER FORMATION:1||Strain energy:1||Superconducting films:1||Nano Sphere Lithography:1||Electronic application:1||Van der Waals forces:1||Depletionlayer thickness:1||Peak intensity ratio:1||SENSITIZER:1||nanoparticle:1||polyfluorene:1||ELECTROLUMINESCENCE:1||GAS SENSORS:1||CHEMICAL SENSORS:1||STRUCTURED SURFACES:1||Metal nanoparticles:1||nitrides:1||SINGLECRYSTALS:1||FILM:1||EVAPORATION:1||optical micrograph:1||SCHOTTKY DIODES:1||EPILAYERS:1||Carrier density:1||photoemission spectroscopy:1||Atoms:1||Inline electron holography:1||InGaN:1||Inhomogeneous distribution:1||JOINT:1||Vanadium compounds:1||H2 EVOLUTION:1||Graphene:1||Nanorods:1||RUTILE:1||polarization engineering:1||BLUE LASERDIODES:1||antireflection:1||ELECTROLUMINESCENCE EFFICIENCY:1||NITRIDES:1||OUTCOUPLING ENHANCEMENT:1||Light absorption:1||Platinum:1||Titanium dioxide:1||GaInN:1||metalorganic vaporphase epitaxy:1||PERFECT ANTIREFLECTION COATINGS:1||IV:1||BASALPLANE DISLOCATION:1||LAMPS:1||Ionization:1||Indium:1||TEMPERATURE:1||STRENGTH:1||ALLOYS:1||Deepultraviolet lightemitting diodes:1||Microwaves:1||Selenium compounds:1||Sulfur compounds:1||Transition metals:1||Catalytic materials:1||Thin films:1||PHOTOELECTROCHEMICAL HYDROGEN EVOLUTION:1||Zinc oxide:1||Electroluminescent:1||Van der waals:1||IIVI semiconductors:1||

Open Access System for Information Sharing

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Open Access System for Information Sharing

Keyword

Publication & Time Cited Count(For the Last 5 years)

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Publication & Time Cited Count
(For the Last 5 years)