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Cited 157 time in webofscience Cited 171 time in scopus
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Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution

Title
Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
Authors
Chu, YSYi, JMDe Carlo, FShen, QLee, WKWu, HJWang, CLWang, JYLiu, CJWang, CHWu, SRChien, CCHwu, YTkachuk, AYun, WFeser, MLiang, KSYang, CSJe, JHMargaritondo, G
POSTECH Authors
Je, JH
Date Issued
Jan-2008
Publisher
AMER INST PHYSICS
URI
http://oasis.postech.ac.kr/handle/2014.oak/9641
DOI
10.1063/1.2857476
ISSN
0003-6951
Article Type
Article
Citation
APPLIED PHYSICS LETTERS, vol. 92, no. 10, 2008-01
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 JE, JUNG HO
Dept of Materials Science & Enginrg
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