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Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors

Title
Reliability Characteristics in Junctionless Poly-Si Thin-Film Transistors
Authors
이정수
POSTECH Authors
이정수
Date Issued
22-Feb-2016
Publisher
KCS
URI
http://oasis.postech.ac.kr/handle/2014.oak/72372
Article Type
Conference
Citation
제23회 한국반도체학술대회 (KCS 2016), 2016-02-22
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 LEE, JEONG SOO
Dept of Electrical Enginrg
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