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Investigation of stress-induced instability of SiC DMOSFETs

Title
Investigation of stress-induced instability of SiC DMOSFETs
Authors
이정수
POSTECH Authors
이정수
Date Issued
23-Feb-2016
Publisher
KCS
URI
http://oasis.postech.ac.kr/handle/2014.oak/72369
Article Type
Conference
Citation
제23회 한국반도체학술대회 (KCS 2016), 2016-02-23
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 LEE, JEONG SOO
Dept of Electrical Enginrg
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