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2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution

Title
2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
Authors
오상호송경Christoph T. Koch김동영김종규
POSTECH Authors
오상호
Date Issued
25-Jun-2013
Publisher
LED EXPO
URI
http://oasis.postech.ac.kr/handle/2014.oak/66710
Article Type
Conference
Citation
International LED and Green lighting conference 2013, 2013-06-25
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 OH, SANG HO
Dept of Materials Science & Enginrg
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