In-situ TEM observation of switching process of phase change random access memory devices
- In-situ TEM observation of switching process of phase change random access memory devices
- 오상호; 백경준; 송경; 손성규; 오장원; 김호정
- POSTECH Authors
- Date Issued
- Article Type
- 2013 MRS Spring Meeting, 2013-04-02
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