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Analysis of Bias-Stress Effect in Organic Transistors by Decoupling the Charge Traps in Semiconductors and Gate-Dielectrics

Title
Analysis of Bias-Stress Effect in Organic Transistors by Decoupling the Charge Traps in Semiconductors and Gate-Dielectrics
Authors
조길원진경식강문성김민김해나조정호
POSTECH Authors
조길원
Date Issued
11-Apr-2013
Publisher
한국고분자학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/65968
Article Type
Conference
Citation
2013 한국고분자학회 춘계 정기총회 및 연구논문 발표회, 2013-04-11
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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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