Effect of dynamic stress on OFF leakage of small-dimension pMOSFETs at high temperature
- Effect of dynamic stress on OFF leakage of small-dimension pMOSFETs at high temperature
- 강봉구; 김강준
- POSTECH Authors
- Date Issued
- The Japan Society of Applied Physics
- Article Type
- SSDM(International Conference on Solid State Devices and Materials), 2013-09-23
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