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Structural dependence of grain boundary resistivity in copper nanowires

Title
Structural dependence of grain boundary resistivity in copper nanowires
Authors
김태환
POSTECH Authors
김태환
Date Issued
10-Dec-2010
Publisher
Japan Society of Applied Physics
URI
http://oasis.postech.ac.kr/handle/2014.oak/65121
Article Type
Conference
Citation
18th International Colloquium on Scanning Probe Microscopy, 2010-12-10
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 KIM, TAE HWAN
Dept of Physics
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