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Bias-Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Field-Effect Transistors

Title
Bias-Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Field-Effect Transistors
Authors
조길원
POSTECH Authors
조길원
Date Issued
14-May-2012
Publisher
European Materials Research Society
URI
http://oasis.postech.ac.kr/handle/2014.oak/63974
Article Type
Conference
Citation
2012 EMRS Spring meeting, 2012-05-14
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조길원CHO, KIL WON
Dept. of Chemical Enginrg
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