Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

An Experimental Study on Channel Backscattering in High-k/Metal Gate nMOSFETs

Title
An Experimental Study on Channel Backscattering in High-k/Metal Gate nMOSFETs
Authors
정윤하
POSTECH Authors
정윤하
Date Issued
14-Oct-2012
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/63810
Article Type
Conference
Citation
2012 IEEE International Integrated Reliability Workshop, 2012-10-14
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

정윤하JEONG, YOON HA
Dept of Electrical Enginrg
Read more

Views & Downloads

Browse