Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution

Title
2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
Authors
오상호송경Christoph T. Koch김종규정혁재김형섭
POSTECH Authors
오상호
Date Issued
29-Nov-2012
Publisher
Materials Research Society
URI
http://oasis.postech.ac.kr/handle/2014.oak/63354
Article Type
Conference
Citation
2012 MRS Fall Meeting, 2012-11-29
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

 OH, SANG HO
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse