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2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution

Title
2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
Authors
김종규송경Christoph T. Koch정혁재김형섭오상호
POSTECH Authors
김종규
Date Issued
25-Nov-2012
Publisher
MRS
URI
http://oasis.postech.ac.kr/handle/2014.oak/62928
Article Type
Conference
Citation
2012 MRS Fall Meeting, 2012-11-25
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 KIM, JONG KYU
Dept of Materials Science & Enginrg
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