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Effect of electron–electron scattering at an elevated temperature on device

Title
Effect of electron–electron scattering at an elevated temperature on device
Authors
강봉구이선행
POSTECH Authors
강봉구
Date Issued
1-Oct-2012
Publisher
Microelectronics Reliability
URI
http://oasis.postech.ac.kr/handle/2014.oak/62645
Article Type
Conference
Citation
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01
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 KANG, BONG KOO
Dept of Electrical Enginrg
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