Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation

Title
Comparative Study of Geometry-dependent Capacitances of Planar FETs and Double-Gate FinFETs: Optimization and Process Variation
Authors
이정수
POSTECH Authors
이정수
Date Issued
24-Apr-2012
Publisher
VLSI Technology, Systems and Applications (VLSI-TSA)
URI
http://oasis.postech.ac.kr/handle/2014.oak/62369
Article Type
Conference
Citation
VLSI Technology, Systems and Applications (VLSI-TSA), 2012-04-24
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

 LEE, JEONG SOO
Dept of Electrical Enginrg
Read more

Views & Downloads

Browse