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Dielectric Degradation and Breakdown of High-k/Metal Gate Stack nMOSFETs

Title
Dielectric Degradation and Breakdown of High-k/Metal Gate Stack nMOSFETs
Authors
이정수
POSTECH Authors
이정수
Date Issued
27-Jun-2012
Publisher
IEEK Summer Conference
URI
http://oasis.postech.ac.kr/handle/2014.oak/62352
Article Type
Conference
Citation
2012 IEEK Summer Conference, 2012-06-27
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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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