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Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs

Title
Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs
Authors
이정수
POSTECH Authors
이정수
Date Issued
24-Jul-2012
Publisher
International Conference on Superlattices, Nanostructures, and Nanodevices
URI
http://oasis.postech.ac.kr/handle/2014.oak/62350
Article Type
Conference
Citation
International Conference on Superlattices, Nanostructures, and Nanodevices, 2012-07-24
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이정수LEE, JEONG SOO
Dept of Electrical Enginrg
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