Hot carrier Effect on RF Chracteristics of High-k Metal Gate SiGe Channel pMOSFETs
- Hot carrier Effect on RF Chracteristics of High-k Metal Gate SiGe Channel pMOSFETs
- POSTECH Authors
- Date Issued
- IEEE Electron Devices Society
- Article Type
- 2011 International Conference on Solid State s and Materials, 2011-09-28
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