Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Hot carrier Effect on RF Chracteristics of High-k Metal Gate SiGe Channel pMOSFETs

Title
Hot carrier Effect on RF Chracteristics of High-k Metal Gate SiGe Channel pMOSFETs
Authors
이정수
POSTECH Authors
이정수
Date Issued
28-Sep-2011
Publisher
IEEE Electron Devices Society
URI
http://oasis.postech.ac.kr/handle/2014.oak/61725
Article Type
Conference
Citation
2011 International Conference on Solid State s and Materials, 2011-09-28
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

 LEE, JEONG SOO
Dept of Electrical Enginrg
Read more

Views & Downloads

Browse