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Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique

Title
Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
Authors
이정수
POSTECH Authors
이정수
Date Issued
18-Oct-2011
Publisher
IEEE Nanotechnology Council
URI
http://oasis.postech.ac.kr/handle/2014.oak/61724
Article Type
Conference
Citation
2011 IEEE Nanotechnology Materials and Devices Conference, 2011-10-18
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 LEE, JEONG SOO
Dept of Electrical Enginrg
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