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Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs

Title
Low-Frequency Noise Behavior of La-Doped HfSiON/Metal Gate nMOSFETs
Authors
정윤하
POSTECH Authors
정윤하
Date Issued
14-Apr-2011
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/61509
Article Type
Conference
Citation
International Reliability Physics Symposium, 2011-04-14
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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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