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In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films

Title
In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
Authors
오상호신가영이호녕구길호임지성
POSTECH Authors
오상호
Date Issued
19-Oct-2011
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/61129
Article Type
Conference
Citation
IEEE NMDC 2011, 2011-10-19
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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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