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In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- Title
- In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- POSTECH Authors
- 오상호
- Date Issued
- 19-Oct-2011
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE NMDC 2011, 2011-10-19
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Related Researcher
- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg