Strain and Charge mapping of LED devices by dark-field inline electron holography
- Strain and Charge mapping of LED devices by dark-field inline electron holography
- 송경; Christoph T. Koch; 이자경; 김종규; 오상호
- POSTECH Authors
- 김종규; 오상호
- Date Issued
- Article Type
- Asia-Pacific Microscopy Conference (ACMN10) & the 2012 International Conference on Nanoscience and Nanotechnology (ICONN2012), 2012-02-06
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