Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Effects of Microstructural Changes on Electrical Properties of Ti/Al based Ohmic Contacts on N-face n-GaN

Title
Effects of Microstructural Changes on Electrical Properties of Ti/Al based Ohmic Contacts on N-face n-GaN
Authors
이종람김범준송양희손준호유학기
POSTECH Authors
이종람
Date Issued
16-Feb-2012
Publisher
제 19회 반도체 학술대회
URI
http://oasis.postech.ac.kr/handle/2014.oak/60678
Article Type
Conference
Citation
제 19회 반도체 학술대회, 2012-02-16
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

 LEE, JONG LAM
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse