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Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature

Title
Impact of OFF-state Degradation under Dynamic Stress on Reliability of Nanoscale n-Channel Metal-Oxide Semiconductor Field-Effect Transistors at Elevated Temperature
Authors
강봉구이남현
POSTECH Authors
강봉구
Date Issued
29-Sep-2011
Publisher
THE JAPAN SOCIETY OF APPLIED PHYSICS
URI
http://oasis.postech.ac.kr/handle/2014.oak/59926
Article Type
Conference
Citation
SSDM(International Conference on Solid State Devices and Materials), 2011-09-29
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강봉구KANG, BONG KOO
Dept of Electrical Enginrg
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