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Low-frequency noise behavior of La-doped Hf/SiON/metal gate nMOSFETs

Title
Low-frequency noise behavior of La-doped Hf/SiON/metal gate nMOSFETs
Authors
이정수
POSTECH Authors
이정수
Date Issued
15-Apr-2011
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/59536
Article Type
Conference
Citation
2011 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2011-04-15
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 LEE, JEONG SOO
Dept of Electrical Enginrg
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