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Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement

Title
Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement
Authors
이기봉황상윤조병관박용준
POSTECH Authors
이기봉
Date Issued
13-Apr-2011
Publisher
한국물리학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/58578
Article Type
Conference
Citation
한국물리학회 2011년 봄학술논문발표회, page. 99 - 99, 2011-04-13
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이기봉LEE, KI BONG
Div. of Advanced Nuclear Enginrg
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