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RF characteristics in Metal Gate/High-K Dielectric nMOSFETs at cryogenic temperature

Title
RF characteristics in Metal Gate/High-K Dielectric nMOSFETs at cryogenic temperature
Authors
백록현사공현철이경택홍승호최현식최길복송승현박민상김재철박찬훈정성우강창용정윤하
POSTECH Authors
백록현
Date Issued
18-Feb-2009
Publisher
대한전자공학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/49830
Article Type
Conference
Citation
16th Korean Conference on Semiconductors (2009), 2009-02-18
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 BAEK, ROCK HYUN
Dept of Electrical Enginrg
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