Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
- 백록현; 이상현; 박찬훈; 고명동; 여경환; 김동원; 김대만; 정윤하
- POSTECH Authors
- Date Issued
- Article Type
- 18th Korean Conference on Semiconductors (2011), 2011-02-16
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