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Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress

Title
Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
Authors
백록현이상현박찬훈고명동여경환김동원김대만정윤하
POSTECH Authors
백록현
Date Issued
16-Feb-2011
Publisher
대한전자공학회
URI
http://oasis.postech.ac.kr/handle/2014.oak/49820
Article Type
Conference
Citation
18th Korean Conference on Semiconductors (2011), 2011-02-16
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 BAEK, ROCK HYUN
Dept of Electrical Enginrg
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