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Characteristics of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects

Title
Characteristics of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects
Authors
백록현백창기최현식사공현철이상현최길복송승현박찬훈이정수여윤영여경환김동원김기남김대만정윤하
POSTECH Authors
백록현
Date Issued
2-May-2010
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/49484
Article Type
Conference
Citation
IEEE IRPS(2010), 2010-05-02
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 BAEK, ROCK HYUN
Dept of Electrical Enginrg
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