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Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique

Title
Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
Authors
백록현김예람이상현백창기여경환김동원이정수정윤하
POSTECH Authors
백록현
Date Issued
19-Oct-2011
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/49478
Article Type
Conference
Citation
IEEE Nanotechnology Materials and Devices Conference (NMDC2011), 2011-10-19
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 BAEK, ROCK HYUN
Dept of Electrical Enginrg
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