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dc.contributor.author이정수ko
dc.date.accessioned2018-05-23T16:19:57Z-
dc.date.available2018-05-23T16:19:57Z-
dc.date.created2011-01-24-
dc.date.issued2010-10-12-
dc.identifier.citationIEEE Nanotechnology Materials and Devices conference-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/47643-
dc.publisherIEEE-
dc.titleReliability properties in sub-50 nm high performance high-k.metal gate stacks SiGe pMOSFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.contributor.localauthor이정수-
dc.citation.titleIEEE Nanotechnology Materials and Devices conference-
dc.description.journalClass1-
dc.identifier.conferencecountryUS-

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