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dc.contributor.author김종규ko
dc.contributor.authorY. Xiko
dc.contributor.authorS. Chhajedko
dc.contributor.authorJ. –Q. Xiko
dc.contributor.authorJ. M. Shahko
dc.contributor.authorE. Fred Schubertko
dc.date.accessioned2018-05-23T15:33:17Z-
dc.date.available2018-05-23T15:33:17Z-
dc.date.created2010-06-02-
dc.date.issued2005-01-22-
dc.identifier.citationSPIE Photonics West-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/46785-
dc.publisherSPIE Photonics West-
dc.titleJunction and carrier temperature measurements in light-emitting diodes using three different methods-
dc.typeConference-
dc.type.rimsCONF-
dc.contributor.localauthor김종규-
dc.contributor.nonIdAuthorY. Xi-
dc.contributor.nonIdAuthorS. Chhajed-
dc.contributor.nonIdAuthorJ. –Q. Xi-
dc.contributor.nonIdAuthorJ. M. Shah-
dc.contributor.nonIdAuthorE. Fred Schubert-
dc.citation.titleSPIE Photonics West-
dc.description.journalClass1-
dc.identifier.conferencecountryUS-

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