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Junction and carrier temperature measurements in light-emitting diodes using three different methods

Title
Junction and carrier temperature measurements in light-emitting diodes using three different methods
Authors
김종규Y. XiS. ChhajedJ. –Q. XiJ. M. ShahE. Fred Schubert
POSTECH Authors
김종규
Date Issued
22-Jan-2005
Publisher
SPIE Photonics West
URI
http://oasis.postech.ac.kr/handle/2014.oak/46785
Article Type
Conference
Citation
SPIE Photonics West, 2005-01-22
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 KIM, JONG KYU
Dept of Materials Science & Enginrg
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