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Junction temperature and thermal resistance measurement in deep-UV light-emitting diodes

Title
Junction temperature and thermal resistance measurement in deep-UV light-emitting diodes
Authors
김종규Y. XiJ.-Q. XiT. GessmannJ. M. ShahE. Fred SchubertA. J. FischerM. H. CrawfordK. H. A. BogartA. A. Allerman
POSTECH Authors
김종규
Date Issued
17-Mar-2005
Publisher
Connecticut Symposium on Microelectronics and Optoelectronics
URI
http://oasis.postech.ac.kr/handle/2014.oak/46782
Article Type
Conference
Citation
Connecticut Symposium on Microelectronics and Optoelectronics, 2005-03-17
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 KIM, JONG KYU
Dept of Materials Science & Enginrg
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