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PBTI Associated Hot Carrier Characteristics of Nano-scale NMOSFETs with Advanced Gate Stack of Metal Gate/High-k Dielectrics

Title
PBTI Associated Hot Carrier Characteristics of Nano-scale NMOSFETs with Advanced Gate Stack of Metal Gate/High-k Dielectrics
Authors
정윤하
POSTECH Authors
정윤하
Date Issued
6-Dec-2007
Publisher
IEEE
URI
http://oasis.postech.ac.kr/handle/2014.oak/46301
Article Type
Conference
Citation
in 38th IEEE Semiconductor Interface Specialists Conference, page. 8, 2007-12-06
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 JEONG, YOON HA
Dept of Electrical Enginrg
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