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Hot Electron Degradation Effects in 35-nm InAlAs/InGaAs Metamorphic HEMT

Title
Hot Electron Degradation Effects in 35-nm InAlAs/InGaAs Metamorphic HEMT
Authors
정윤하
POSTECH Authors
정윤하
Date Issued
28-Nov-2009
Publisher
IEEK
URI
http://oasis.postech.ac.kr/handle/2014.oak/46259
Article Type
Conference
Citation
2009 IEEK FALL CONFERENCE, 2009-11-28
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 JEONG, YOON HA
Dept of Electrical Enginrg
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